39MM CCD Microscope stents,ZJ-607
Stand Throat Depth: 129mm
Coarse/Fine Focus Type: Coaxial Coarse/Fine Focus
Net weight: 3.85kg (8.49lbs)
Knowledge about the scanning electron microscope
The most common SEM mode is detection of secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons that can be detected depends, among other things, on specimen topography. By scanning the sample and collecting the secondary electrons that are emitted using a special detector, an image displaying the topography of the surface is created.